Provided Services (Already available)
Evaluation
In-situ analytical techniques using synchrotron X-ray diffraction at SPring-8:
- Atomic-level observation of nitride semiconductor thin-film growth processes
- Non-destructive 3D visualization of shape, defects, and strain distribution in nanocrystals contained in semiconductor process-related nanomaterials (e.g., nanodots, nanowires, conductive nanoinks, fillers) using Bragg Coherent Diffraction Imaging (BCDI)
- Evaluation of magnetic properties in spintronic devices and analysis of the local electronic, magnetic, and lattice vibrational states of dopant atoms in semiconductors using synchrotron Mössbauer spectroscopy
Provided Services (Provided in future)
Evaluation
- Non-destructive, high-resolution (～200 nm) 3D visualization of defect structures and stress fields in bulk semiconductor crystals using synchrotron X-ray diffraction topography technology at SPring-8
(Service launch scheduled around January 2026)