Process Support for Various Devices Devices using 2D materials Compound semiconductor high-frequency devices Diamond semiconductor devices Semiconductor photonic devices
Evaluation
Local structural analysis of semiconductor materials using transmission electron microscopy (TEM)
Crystal structure evaluation of semiconductor materials by X-ray diffraction (XRD)
Interface state analysis of semiconductors using hard X-ray photoelectron spectroscopy (HAXPES)
Stress evaluation of semiconductor substrates using Raman imaging
Provided Services (Provided in future)
Evaluation
Nano-level strain evaluation of semiconductor materials (Service launch scheduled around March 2026)