Japan Advanced Institute of Science and Technology (JAIST)

Provided Services (Already available)

Prototype

• Single FET prototyping (GaN, oxides, etc.)
• 2D semiconductors (graphene, MoS₂, etc.)
• Solar cells (Si, perovskite, etc.)
• Organic semiconductors (transistors, EL, solar cells, etc.)

Evaluation

• Nanoscale structural evaluation of device material interfaces using transmission electron microscopy (STEM-EDX/EELS, TEM-EDS)
• Surface structure evaluation of devices using multifunctional microscopes (FESEM-EDX/EBSD/EBIC, SAM, AFM)
• Electronic level and work function evaluation of organic semiconductor materials using spectroscopic equipment (XPS, PYS)
• Degradation mechanism analysis of organic semiconductor thin films using mass spectrometry

Provided Services (Provided in future)

Evaluation

• Device processing and evaluation using FIB-SEM-EDX
  (Service launch scheduled around April 2026)