【公開日：2025.06.10】【最終更新日：2025.05.09】

課題データ / Project Data

課題番号 / Project Issue Number

24HK0021

利用課題名 / Title

二酸化炭素資源化するプラズモン増強光電極の構築 

利用した実施機関 / Support Institute

北海道大学 / Hokkaido Univ.

機関外・機関内の利用 / External or Internal Use

内部利用（ARIM事業参画者以外）/Internal Use (by non ARIM members)

技術領域 / Technology Area

【横断技術領域 / Cross-Technology Area】（主 / Main）加工・デバイスプロセス/Nanofabrication（副 / Sub）-

【重要技術領域 / Important Technology Area】（主 / Main）量子・電子制御により革新的な機能を発現するマテリアル/Materials using quantum and electronic control to perform innovative functions（副 / Sub）-

キーワード / Keywords

原子薄膜/ Atomic thin film,表面・界面・粒界制御/ Surface/interface/grain boundary control,蒸着・成膜/ Vapor deposition/film formation,スパッタリング/ Sputtering,膜加工・エッチング/ Film processing/etching

利用者と利用形態 / User and Support Type

利用者名（課題申請者）/ User Name (Project Applicant)

申 杰

所属名 / Affiliation

北海道大学 電子科学研究所

共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes

ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes

石旭,松尾保孝

利用形態 / Support Type

（主 / Main）機器利用/Equipment Utilization（副 / Sub）-

利用した主な設備 / Equipment Used in This Project

HK-611：多元スパッタ装置
HK-406：X線光電子分光装置
HK-608：真空蒸着装置
HK-404：超高分解能電界放出形走査電子顕微鏡

報告書データ / Report

概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)

Carbon plays a crucial role by storing or releasing energy through different stages of oxidation, meantime, the main product of fossil fuels which is carbon dioxide will deteriorate the earth's environment. Photochemical method to reduce carbon dioxide has the advatages of high efficiency and environmental friendly.
Our study aims to develop a novel photocathode for photochemical carbon dioxide reduction. In this study, we use fabricating NiO film as  a photocathode and modify it with nanoscale metal articles to enchance the photochemical reduction of carbon dioxide under visible light irradiation.

実験 / Experimental

NiO films with different oxygen contents were deposited by using of Muti-sputtering equipment (QAM-4-ST).
Annealing treatment was added in this experiment, samples were annealed under 100, 200, and 300 centigrade and then absorption spectrum were measured.
IPCE (Incident Photon Current Efficiency) under different temperatures and oxygen contents were measured. The X-ray Photoelectron Spectrum was measured by X-ray Photoelectron Spectrometer (JPS-9200)
The surface morphology was observed by using of SEM equipment (SU-8230).

結果と考察 / Results and Discussion

By observing the experimen result. when the annealing temperature was increased, the light absorption was decreased, that is because defects were reduced during the annealing. 
From the absorption spuctrum and oxygen content we know that defects like Ni vacancies and interstitial oxygen can narrowing the band gap, and NiO with high defect concentration is more easily obtained under oxygen-rich conditions.
The annealed NiO film has larger grains and reduced defect density, which is beneficial to the conduction of electrons and holes.(Fig.1)
IPCE (Incident Photon Current Efficiency) under different tempreature and oxygen contents as shown in Figure 2.Annealing treatment can control the band gap by controlling the defect concertration of NiO film which means we can changing the defect density in the film by adjusting the annealing temperature and oxygen concentration.
X-ray Photoelectron Specturm of NiO film as shown in Figure 3.

図・表・数式 / Figures, Tables and Equations

Fig.1

Fig.2

Fig.3

その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)

成果発表・成果利用 / Publication and Patents

論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)

口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.

特許 / Patents

特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件