【公開日：2025.07.10】【最終更新日：2025.07.10】
課題データ / Project Data
課題番号 / Project Issue Number
22UT0388
利用課題名 / Title
Oxide interface→Atomic structural analysis of oxide interface
利用した実施機関 / Support Institute
東京大学 / Tokyo Univ.
機関外・機関内の利用 / External or Internal Use
内部利用（ARIM事業参画者以外）/Internal Use (by non ARIM members)
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）革新的なエネルギー変換を可能とするマテリアル/Materials enabling innovative energy conversion（副 / Sub）次世代ナノスケールマテリアル/Next-generation nanoscale materials
キーワード / Keywords
電子顕微鏡/Electron microscopy,燃料電池/ Fuel cell,ナノ粒子/ Nanoparticles
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
Tam Hoi Tat Jason
所属名 / Affiliation
東京大学大学大学院工学系研究科総合研究機構
共同利用者氏名 / Names of Collaborators Excluding Supporters in the Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Supporters in the Hub and Spoke Institutes
利用形態 / Support Type
（主 / Main）機器利用/Equipment Utilization（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
Yttria stabilized zirconia (YSZ) represents an important class of oxide ceramics with applications ranging from solid electrolyte in fuel cells, cutting tools, and dental materials. In order to optimize the properties (e.g. ionic conductivity, fracture toughness) for its intended application, the structure and chemistry of the interfaces of YSZ at the atomic scale, including grain boundaries and interphase interfaces needs to be well controlled and understood. Spherical aberration corrected (Cs-corrected) scanning transmission electron microscopy is a well-suited technique to explore these interfaces at high spatial resolution.
実験 / Experimental
YSZ bicrystal specimens were fabricated by joining two precisely aligned cubic YSZ single crystals. The electron transparent specimens were fabricated by conventional ion milling technique. The main analytical instrument used for this study was a Cs-corrected STEM, JEOL JEM-ARM200CF equipped with dual energy dispersive X-ray spectroscopy (EDS) detectors and an electron energy loss spectroscopy (EELS) system.
結果と考察 / Results and Discussion
Figure 1 shows a high angle annular dark field (HAADF) image and EDS elemental maps of a YSZ Σ3 coherent twin boundary. Ordered segregation of yttrium can be clearly observed. Despite the large solid angle of the dual EDS detector system, the total acquisition time for the elemental maps was rather long (about 1 hour). EELS was also applied to reduce the acquisition time of elemental maps, in addition to obtaining chemical state information which can provide insights on the transport behaviour of ions across the interface.
図・表・数式 / Figures, Tables and Equations
Fig 1. HAADF image and EDS elemental map of YSZ Σ3 coherent twin boundary.
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
This work is supported by Japan Society for the Promotion of Science Postdoctoral Fellowship for Research in Japan (Short-term).
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications：0件
特許登録件数 / Number of Registered Patents：0件